Metallurgical Microscopes MT8500 Series
Meiji Techno's new upright incident and transmitted light metallurgical microscope with Brightfield/Darkfield is the new and cost-effective MT8500 Series. The MT8500 Series employs all new and improved Plan Episcopic optical system. Meiji Techno's ICOS™ (Infinity Corrected Optical System) makes the observation and evaluation of metallurgical specimens fast and easy while delivering an excellent cost-to-performance ratio. The MT8500 Series features include:
- Computer Aided Design
- Ergonomically positioned controls
- Comfortable Siedentopf viewing head
- 50W Vertical Koehler Illuminator with auto voltage sensing power supply
- 30W Transmitted Koehler Illuminator with auto voltage sensing power supply
- Brightfield, Darkfield and Simple Polarized Light observation modes
- Optional Ergonomic binocular viewing head available
- VIEWING HEADS
Model MA815 is the Siedentopf-type binocular head and Model MA816 is the trinocular head for camera integration. Each head has the eyetubes inclined at 30° with the left eyetube having graduated diopter settings. The interpupillary distance is adjustable between 53mm - 75mm. An 80/20 beamsplitter for the trinocular tube can be engaged for photo work. The optional Ergonomic Viewing Head has the inclination adjustable from 10 to 50 degrees to fit any size user.
10X Super Widefield High Eyepoint eyepieces F.N.22 are standard, and 15X and 20X eyepieces are available as an option. A Super Widefield High Eyepoint 10X focusable eyepiece that accepts 25mm reticules is also available.
- OBJECTIVE CHANGER
The smooth-operating, ball bearing mounted, quadruple nosepiece provides effortless objective changes.
Meiji Techno offers an assortment of Plan Epi Infinity Corrected objectives for Brightfield work
Ceramic coated left or right-handed, flat top stage measures 191mm x 126mm with travel: 100mm(X) x 100mm(Y). Ergonomically positioned coaxial drop down controls.
Powerful 50 watt halogen vertical illumination along with 30W Transmitted Koehler Illumination provides super enhanced image quality and brightness for the observation of metallurgical specimens and photomicroscopy.